Very complex systems in electronics (on chip or on boards) have become almost impossible to test. The time required to test the complete functionality and the associated testing cost have become both prohibitive. Therefore, it is generally resolved to test only the functions that are deemed most important, but the number of performance verification events is a very small fraction of all the possible tests. This may cause failures at the customer site (OEM) leading to product recalls or, in some cases, catastrophic occurrences for the final user, resulting in high liability and loss of reputation.

Awenyx AI Smart Testing tool is able to obtain high coverage of the most important tests in complex systems by learning, during operation, what the critical tests are and correlate data of various tests to gain efficiency (reduced number of tests) and increase functionality coverage.

Examples of how Awenyx Self-Learning Tester performs learning in integrated circuit testing can comprise completing the chip testing also when the chip fails so that, by verifying what else is failing, the AI tool can learn the correlation between failures. When enough data is collected, Awenyx Self-Learning Tester can prioritize the tests to reduce test time and/or minimize the number of tests required in complex systems.